US PATENT SUBCLASS 714 / 733
.~ Built-in testing circuit (BILBO)


Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

724  DF  DIGITAL LOGIC TESTING {10}
733.~ Built-in testing circuit (BILBO)


DEFINITION

Classification: 714/733

Built-in test circuit (BILBO):

(under subclass 724) Subject matter in which the digital logic testing equipment includes a selectively configurable shift register, structurally a part of the device being tested.

(1) Note. Some selective configurations of the shift register include a latch, linear shift register, multiple input signature register, and a forced reset.

(2) Note. Included herein are built-in logic block observation (BILBO) devices.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing, appropriate subclass, particularly

73.1, for measuring and testing of electrical device parameters under controlled conditions.

377, Electrical Pulse Counters, Pulse Dividers, or Shift Registers,

19+, for a shift register used for measuring or testing; and subclass 28 for error checking or correction in a shift register system.