(under subclass 724) Subject matter in which the digital logic testing equipment includes a selectively configurable shift register, structurally a part of the device being tested.
(1) Note. Some selective configurations of the shift register include a latch, linear shift register, multiple input signature register, and a forced reset.
(2) Note. Included herein are built-in logic block observation (BILBO) devices.
SEE OR SEARCH CLASS
324, Electricity: Measuring and Testing, appropriate subclass, particularly
73.1, for measuring and testing of electrical device parameters under controlled conditions.
377, Electrical Pulse Counters, Pulse Dividers, or Shift Registers,
19+, for a shift register used for measuring or testing; and subclass 28 for error checking or correction in a shift register system.
