US PATENT SUBCLASS 714 / 728-- .~.~ Random pattern generation (includes pseudorandom pattern)

US PATENT SUBCLASS 714 / 728
.~.~ Random pattern generation (includes pseudorandom pattern)

Current as of: June, 1999
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714 /	HD	ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

724	DF	DIGITAL LOGIC TESTING {10}
726	DF	.~ Scan path testing (e.g., level sensitive scan design (LSSD)) {5}
728		.~.~ Random pattern generation (includes pseudorandom pattern)

DEFINITION

Classification: 714/728

Random pattern generation (includes pseudorandom pattern)

(under subclass 726) Subject matter where a series of digits is generated in an unpredictable, incoherent, or arbitrary pattern.

(1) Note. Included herein is generation of a series of digits which simulates a random pattern.

SEE OR SEARCH THIS CLASS, SUBCLASS:

715, for test pattern with comparison in testing a transmission facility.

720, for use of special test patterns in memory testing.

739, for random test pattern generation in general.

SEE OR SEARCH CLASS

708, Electrical Computers and Digital Processing Systems-Arithmetic Processing and Calculating, 250+, for random number generation.