US PATENT SUBCLASS 714 / FOR 134
.~.~ Plural scan paths (371/22.34)

Current as of: June, 1999
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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

FOR 129  DF  DIGITAL LOGIC TESTING (371/22.1) {10}
FOR 131  DF  .~ Scan path testing (e.g., level sensitive scan design (LSSD)) (371/22.31) {5}
FOR 134.~.~ Plural scan paths (371/22.34)

DEFINITION

Classification: 714/FOR.134

Plural scan paths:

Foreign art collections including subject matter having more than one group of shift register latches connected in series, and which groups form a plurality of shift paths (scan paths) along which data can be transmitted.