US PATENT SUBCLASS 714 / FOR 100
.~ Scan path testing (LSSD) (371/FOR 100)

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714 /   HD   ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY

825  DF  MISCELLANEOUS {4}
FOR 100.~ Scan path testing (LSSD) (371/FOR 100)

DEFINITION

Classification: 714/FOR.100

Scan path testing (LSSD):

Foreign art collections including subject matter in which digital logic is designed for improved test ability by including shift register latches (SRL) to enable the configuring of the circuitry in combinational logic form.