438 / | HD | SEMICONDUCTOR DEVICE MANUFACTURING: PROCESS |
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142 | DF | MAKING FIELD EFFECT DEVICE HAVING PAIR OF ACTIVE REGIONS SEPARATED BY GATE STRUCTURE BY FORMATION OR ALTERATION OF SEMICONDUCTIVE ACTIVE REGIONS {6} |
197 | | .~ Having insulated gate (e.g., IGFET, MISFET, MOSFET, etc.) {24} |
198 | DF | .~.~> Specified crystallographic orientation |
199 | DF | .~.~> Complementary insulated gate field effect transistors (i.e., CMOS) {11} |
234 | DF | .~.~> Including bipolar transistor (i.e., BiMOS) {2} |
237 | DF | .~.~> Including diode |
238 | DF | .~.~> Including passive device (e.g., resistor, capacitor, etc.) {1} |
257 | DF | .~.~> Having additional gate electrode surrounded by dielectric (i.e., floating gate) {8} |
268 | DF | .~.~> Vertical channel {3} |
275 | DF | .~.~> Making plural insulated gate field effect transistors of differing electrical characteristics {1} |
279 | DF | .~.~> Making plural insulated gate field effect transistors having common active region |
280 | DF | .~.~> Having underpass or crossunder |
281 | DF | .~.~> Having fuse or integral short |
282 | DF | .~.~> Buried channel |
283 | DF | .~.~> Plural gate electrodes (e.g., dual gate, etc.) |
284 | DF | .~.~> Closed or loop gate |
285 | DF | .~.~> Utilizing compound semiconductor |
286 | DF | .~.~> Asymmetric |
287 | DF | .~.~> Gate insulator structure constructed of diverse dielectrics (e.g., MNOS, etc.) or of nonsilicon compound |
288 | DF | .~.~> Having step of storing electrical charge in gate dielectric |
289 | DF | .~.~> Doping of semiconductive channel region beneath gate insulator (e.g., adjusting threshold voltage, etc.) {2} |
292 | DF | .~.~> Direct application of electrical current |
293 | DF | .~.~> Fusion or solidification of semiconductor region |
294 | DF | .~.~> Including isolation structure {3} |
299 | DF | .~.~> Self-aligned {2} |
308 | DF | .~.~> Radiation or energy treatment modifying properties of semiconductor regions of substrate (e.g., thermal, corpuscular, electromagnetic, etc.) |