| 438 / | HD | SEMICONDUCTOR DEVICE MANUFACTURING: PROCESS |
|
| 689 | DF | CHEMICAL ETCHING {6} |
| 706 | DF | .~ Vapor phase etching (i.e., dry etching) {3} |
| 707 | DF | .~.~ Utilizing electromagnetic or wave energy {3} |
| 710 |  | .~.~.~ By creating electric field (e.g., plasma, glow discharge, etc.) {17} |
| 711 | DF | .~.~.~.~> Utilizing multiple gas energizing means |
| 712 | DF | .~.~.~.~> Reactive ion beam etching (i.e., RIBE) |
| 713 | DF | .~.~.~.~> Forming tapered profile (e.g., tapered etching, etc.) |
| 714 | DF | .~.~.~.~> Including change in etch influencing parameter (e.g., energizing power, etchant composition, temperature, etc.) |
| 715 | DF | .~.~.~.~> With substrate heating or cooling |
| 716 | DF | .~.~.~.~> With substrate handling (e.g., conveying, etc.) |
| 717 | DF | .~.~.~.~> Utilizing multilayered mask |
| 718 | DF | .~.~.~.~> Compound semiconductor |
| 719 | DF | .~.~.~.~> Silicon |
| 720 | DF | .~.~.~.~> Electrically conductive material (e.g., metal, conductive oxide, etc.) {1} |
| 722 | DF | .~.~.~.~> Metal oxide |
| 723 | DF | .~.~.~.~> Silicon oxide or glass |
| 724 | DF | .~.~.~.~> Silicon nitride |
| 725 | DF | .~.~.~.~> Organic material (e.g., resist, etc.) |
| 726 | DF | .~.~.~.~> Having microwave gas energizing {1} |
| 729 | DF | .~.~.~.~> Using specified electrode/susceptor configuration (e.g., of multiple substrates using barrel-type susceptor, planar reactor configuration, etc.) to generate plasma {1} |
| 732 | DF | .~.~.~.~> Using magnet (e.g., electron cyclotron resonance, etc.) |