438 / | HD | SEMICONDUCTOR DEVICE MANUFACTURING: PROCESS |
|
689 | DF | CHEMICAL ETCHING {6} |
706 | DF | .~ Vapor phase etching (i.e., dry etching) {3} |
707 | DF | .~.~ Utilizing electromagnetic or wave energy {3} |
710 | | .~.~.~ By creating electric field (e.g., plasma, glow discharge, etc.) {17} |
711 | DF | .~.~.~.~> Utilizing multiple gas energizing means |
712 | DF | .~.~.~.~> Reactive ion beam etching (i.e., RIBE) |
713 | DF | .~.~.~.~> Forming tapered profile (e.g., tapered etching, etc.) |
714 | DF | .~.~.~.~> Including change in etch influencing parameter (e.g., energizing power, etchant composition, temperature, etc.) |
715 | DF | .~.~.~.~> With substrate heating or cooling |
716 | DF | .~.~.~.~> With substrate handling (e.g., conveying, etc.) |
717 | DF | .~.~.~.~> Utilizing multilayered mask |
718 | DF | .~.~.~.~> Compound semiconductor |
719 | DF | .~.~.~.~> Silicon |
720 | DF | .~.~.~.~> Electrically conductive material (e.g., metal, conductive oxide, etc.) {1} |
722 | DF | .~.~.~.~> Metal oxide |
723 | DF | .~.~.~.~> Silicon oxide or glass |
724 | DF | .~.~.~.~> Silicon nitride |
725 | DF | .~.~.~.~> Organic material (e.g., resist, etc.) |
726 | DF | .~.~.~.~> Having microwave gas energizing {1} |
729 | DF | .~.~.~.~> Using specified electrode/susceptor configuration (e.g., of multiple substrates using barrel-type susceptor, planar reactor configuration, etc.) to generate plasma {1} |
732 | DF | .~.~.~.~> Using magnet (e.g., electron cyclotron resonance, etc.) |