| 438 / | HD | SEMICONDUCTOR DEVICE MANUFACTURING: PROCESS |
| 400 | ![]() | FORMATION OF ELECTRICALLY ISOLATED LATERAL SEMICONDUCTIVE STRUCTURE {10} |
| 401 | DF | .~> Having substrate registration feature (e.g., alignment mark) |
| 402 | DF | .~> And gettering of substrate |
| 403 | DF | .~> Having semi-insulating component |
| 404 | DF | .~> Total dielectric isolation {7} |
| 414 | DF | .~> Isolation by PN junction only {3} |
| 421 | DF | .~> Having air-gap dielectric (e.g., groove, etc.) {1} |
| 423 | DF | .~> Implanting to form insulator |
| 424 | DF | .~> Grooved and refilled with deposited dielectric material {7} |
| 439 | DF | .~> Recessed oxide by localized oxidation (i.e., LOCOS) {9} |
| 454 | DF | .~> Field plate electrode |