438 / | HD | SEMICONDUCTOR DEVICE MANUFACTURING: PROCESS |
400 | FORMATION OF ELECTRICALLY ISOLATED LATERAL SEMICONDUCTIVE STRUCTURE {10} | |
401 | DF | .~> Having substrate registration feature (e.g., alignment mark) |
402 | DF | .~> And gettering of substrate |
403 | DF | .~> Having semi-insulating component |
404 | DF | .~> Total dielectric isolation {7} |
414 | DF | .~> Isolation by PN junction only {3} |
421 | DF | .~> Having air-gap dielectric (e.g., groove, etc.) {1} |
423 | DF | .~> Implanting to form insulator |
424 | DF | .~> Grooved and refilled with deposited dielectric material {7} |
439 | DF | .~> Recessed oxide by localized oxidation (i.e., LOCOS) {9} |
454 | DF | .~> Field plate electrode |