US PATENT SUBCLASS 702 / 71
.~.~.~ Waveform-to-waveform comparison

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
57  DF  .~ Electrical signal parameter measurement system {6}
66  DF  .~.~ Waveform analysis {5}
71.~.~.~ Waveform-to-waveform comparison {3}
72  DF  .~.~.~.~> Phase comparison
73  DF  .~.~.~.~> Identification of waveform
74  DF  .~.~.~.~> Signal-in-signal determination

DEFINITION

Classification: 702/71

Waveform-to-waveform comparison:

(under subclass 66) Subject matter including means for distinguishing or matching a first waveform to a second waveform.

(1) Note. The first and the second waveform can be discrete portions of a continuous wave.

SEE OR SEARCH THIS CLASS, SUBCLASS:

193, for processing of a measured signal including noise removal or extraction by threshold comparison.