US PATENT SUBCLASS 702 / 73
.~.~.~.~ Identification of waveform

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
57  DF  .~ Electrical signal parameter measurement system {6}
66  DF  .~.~ Waveform analysis {5}
71  DF  .~.~.~ Waveform-to-waveform comparison {3}
73.~.~.~.~ Identification of waveform

DEFINITION

Classification: 702/73

Identification of waveform:

(under subclass 71) Subject matter comprising means for classifying an acquired input waveform which is unknown by correlating or comparing its characteristics with those of at least one known or reference waveform.

(1) Note. This subclass includes pulse converting or classifying apparatus.