US PATENT SUBCLASS 702 / 66
.~.~ Waveform analysis

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
57  DF  .~ Electrical signal parameter measurement system {6}
66.~.~ Waveform analysis {5}
67  DF  .~.~.~> Display of waveform {1}
69  DF  .~.~.~> Signal quality (e.g., timing jitter, distortion, signal-to-noise ratio)
70  DF  .~.~.~> Waveform extraction
71  DF  .~.~.~> Waveform-to-waveform comparison {3}
75  DF  .~.~.~> Frequency {2}

DEFINITION

Classification: 702/66

Waveform analysis:

(under subclass 57) Subject matter including means for determining value or parameter of a shape of an electrical wave.

SEE OR SEARCH THIS CLASS, SUBCLASS:

112, for a testing system for determining transfer function in which a sinusoidal signal is used as a stimulus.

124, for signal generation or waveform shaping in a testing system.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing,

76.12+, for analysis of complex waves.