US PATENT SUBCLASS 702 / 70
.~.~.~ Waveform extraction

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
57  DF  .~ Electrical signal parameter measurement system {6}
66  DF  .~.~ Waveform analysis {5}
70.~.~.~ Waveform extraction

DEFINITION

Classification: 702/70

Waveform extraction:

(under subclass 66) Subject matter comprising means for withdrawing a particular waveform from an incoming electrical wave by subjecting the incoming electrical wave to a specific separating technique (e.g., filtering).

(1) Note. This subclass includes means or a procedure to extract information from a noise background.

SEE OR SEARCH THIS CLASS, SUBCLASS:

74, for means for identifying a particular signal within a signal without extraction.

190+, for processing of a measured signal including signal extraction or separation.