US Patent Class 702
DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING-- Main Headings



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Current as of: June, 1999
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CLASS NOTES
1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
85  DF  CALIBRATION OR CORRECTION SYSTEM {18}
108  DF  TESTING SYSTEM {8}
127  DF  MEASUREMENT SYSTEM {15}
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FOREIGN ART COLLECTIONS
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*  DF  APPLICATIONS (364/400) {1}
*  DF  APPLICATIONS (364/400) {1}
*  DF  APPLICATIONS (364/400) {2}
*  DF  APPLICATIONS (364/400) {1}
FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}