US PATENT SUBCLASS 702 / 108
TESTING SYSTEM

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

108TESTING SYSTEM {8}
109  DF  .~> For transfer function determination {3}
113  DF  .~> Of mechanical system {2}
116  DF  .~> Of sensing device
117  DF  .~> Of circuit {3}
121  DF  .~> Including multiple test instruments
122  DF  .~> Including specific communication means
123  DF  .~> Including program set up
124  DF  .~> Signal generation or waveform shaping {2}

DEFINITION

Classification: 702/108

TESTING SYSTEM:

(under the class definition) Subject matter wherein the data processing or calculating means includes a test means for determining a response of a device or a process to an external stimulus.

(1) Note. A mere monitoring system for determining performance of a device or process under normal operation without subjecting the device or process to a specific testing procedure or signal is excluded from this subclass.

SEE OR SEARCH THIS CLASS, SUBCLASS:

1+, for data processing in a specific measurement system.

85+, for data processing in a calibration or correction of measurement system.

127+, for data processing in a generic measurement system.

SEE OR SEARCH CLASS

73, Measuring and Testing, appropriate subclasses for measuring and testing apparatus or processes not found elsewhere.

324, Electricity: Measuring and Testing, appropriate subclasses for measuring or testing electricity, per se.

356, Optics: Measuring and Testing, appropriate subclasses, particularly

72, for optical measuring and testing with plural diverse test or art, subclass 73 for plural test, and subclasses 128+ for refraction testing.

358, Facsimile,

504, for measuring, testing, and calibration of natural color facsimile.

374, Thermal Measuring and Testing,

45+, for thermal testing of nonthermal quantity.