US PATENT SUBCLASS 702 / 124
.~ Signal generation or waveform shaping

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

108  DF  TESTING SYSTEM {8}
124.~ Signal generation or waveform shaping {2}
125  DF  .~.~> Timing signal
126  DF  .~.~> Signal conversion

DEFINITION

Classification: 702/124

Signal generation or waveform shaping:

(under subclass 108) Subject matter wherein the test means includes means for generating a specific type of signal or signal having a specific waveform.

SEE OR SEARCH THIS CLASS, SUBCLASS:

70, for waveform extraction.

190+, for processing of a measured signal including signal extraction or separation.

SEE OR SEARCH CLASS

327, Miscellaneous Active Electrical Nonlinear Devices, Circuits and Systems,

100+, for signal converting, shaping, or generating.