US PATENT SUBCLASS 702 / 117
.~ Of circuit

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

108  DF  TESTING SYSTEM {8}
117.~ Of circuit {3}
118  DF  .~.~> Testing multiple circuits
119  DF  .~.~> Including program initialization (e.g., program loading) or code selection (e.g., program creation)
120  DF  .~.~> Including input/output or test mode selection means

DEFINITION

Classification: 702/117

Of circuit:

(under subclass 108) Subject matter wherein the test means is applied to the interconnection of electronic components in a closed path.

SEE OR SEARCH THIS CLASS, SUBCLASS:

107, for circuit tuning.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing,

500+, for fault testing in electrical circuits and components, particularly subclasses 537+ for fault testing of individual circuit component or element, subclass 538 for fault testing of electrical connectors, subclasses 765+ for a fault testing of a semiconductor device, subclass 771 for fault testing of a power supply, subclass 726 for transformer testing, subclass 727 for piezoelectric crystal testing, and subclasses 74+ for testing and calibration of electric meters.