US PATENT SUBCLASS 702 / 118
.~.~ Testing multiple circuits

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

108  DF  TESTING SYSTEM {8}
117  DF  .~ Of circuit {3}
118.~.~ Testing multiple circuits

DEFINITION

Classification: 702/118

Testing multiple circuits:

(under subclass 117) Subject matter wherein a plurality of circuits are tested simultaneously or selectively.

(1) Note. This subclass includes a count of a tested object (e.g., good wafers, etc.).

SEE OR SEARCH THIS CLASS, SUBCLASS:

121, for a testing system having multiple test instruments.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing,

73.1, for plural, automatically sequential tests, and subclass 227 for magnetic plural tests.