US PATENT SUBCLASS 702 / FOR 134
MEASURING, TESTING, OR MONITORING (364/550)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 135  DF  .~> Measuring and evaluating (e.g., performance) (364/551.01) {5}
FOR 141  DF  .~> For basic measurements (364/556) {8}
FOR 155  DF  .~> Operations performed (364/570) {11}

DEFINITION

Classification: 702/FOR.134

MEASURING, TESTING, OR MONITORING:

Foreign art collections wherein the data processing system or calculating computer is designed for or utilized in the indication of a condition relating to a measurement, analysis, or continuous detection.