US PATENT SUBCLASS 702 / 1
MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
2  DF  .~> Earth science {4}
19  DF  .~> Biological or biochemical {2}
22  DF  .~> Chemical analysis {6}
33  DF  .~> Mechanical measurement system {6}
57  DF  .~> Electrical signal parameter measurement system {6}
81  DF  .~> Quality evaluation {3}

DEFINITION

Classification: 702/1

MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT

(under the class definition) Subject matter wherein the data processing system or calculating computer includes a measurement system or process designed for or utilized in a particular art device or application.

SEE OR SEARCH THIS CLASS, SUBCLASS:

85+, for data processing in a calibration or correction of a measurement system.

108+, for data processing in a testing system.

127+, for data processing in a generic measurement system.

SEE OR SEARCH CLASS

33, Geometrical Instruments, appropriate subclasses.

73, Measuring and Testing, appropriate subclasses for measuring and testing apparatus or processes not found elsewhere.

324, Electricity: Measuring and Testing, appropriate subclasses for measuring or testing electricity, per se.

356, Optics: Measuring and Testing, appropriate subclasses.

358, Facsimile,

504, for measuring, testing and calibration of natural color facsimile.

368, Horology: Time Measuring System or Devices, appropriate subclasses.

374, Thermal Measuring and Testing, appropriate subclasses.