US PATENT SUBCLASS 702 / 33
.~ Mechanical measurement system

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
33.~ Mechanical measurement system {6}
34  DF  .~.~> Wear or deterioration evaluation
35  DF  .~.~> Flaw or defect detection {4}
41  DF  .~.~> Force or torque measurement {2}
45  DF  .~.~> Flow metering {4}
50  DF  .~.~> Fluid measurement (e.g., mass, pressure, viscosity) {5}
56  DF  .~.~> Vibration detection

DEFINITION

Classification: 702/33

Mechanical measurement system

(under subclass 1) Subject matter wherein the measurement system or process is applicable in the science concerning motion or action of force on body, or the design, construction, operation, and care of mechanical process or structure, or for a solution of a problem in these areas.

SEE OR SEARCH THIS CLASS, SUBCLASS:

105, for calibration of a mechanical system.

113+, for testing of a mechanical system.

SEE OR SEARCH CLASS

73, Measuring and Testing, appropriate subclasses for mechanical measuring system not found elsewhere.