US PATENT SUBCLASS 702 / 35
.~.~ Flaw or defect detection

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
33  DF  .~ Mechanical measurement system {6}
35.~.~ Flaw or defect detection {4}
36  DF  .~.~.~> Location
38  DF  .~.~.~> Electromagnetic (e.g., eddy current)
39  DF  .~.~.~> Sound energy (e.g., ultrasonic)
40  DF  .~.~.~> Radiant energy (e.g., X-ray, infrared, laser)

DEFINITION

Classification: 702/35

Flaw or defect detection:

(under subclass 33) Subject matter wherein the data processing system or calculating computer is designed for or utilized in the study of an object to identify the existence or amount of a fault (e.g., crack or break) of the object.

SEE OR SEARCH CLASS

73, Measuring and Testing,

592, for pipe flaw detection, subclasses 598 and 600 for flaw or discontinuity by measured properties of beam, and subclass 865.8 for inspecting.

324, Electricity: Measuring and Testing,

456, for measuring and testing a material property using electrostatic phenomenon for flaw detection, subclass 216 for a magnetic system for flaw testing, and subclass 238 for a plural test magnetic system having induced voltage type sensor for material flaw testing.

356, Optics: Measuring or Testing, 237+, for inspection for flaws or imperfections.

364, Electrical Computers and Data Processing Systems,

474.17, for the detection of a condition of a tool (e.g., tool wear) in machine manufacturing art.