US PATENT SUBCLASS 702 / 40
.~.~.~ Radiant energy (e.g., X-ray, infrared, laser)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
33  DF  .~ Mechanical measurement system {6}
35  DF  .~.~ Flaw or defect detection {4}
40.~.~.~ Radiant energy (e.g., X-ray, infrared, laser)

DEFINITION

Classification: 702/40

Radiant energy (e.g., X-ray, infrared, laser):

(under subclass 35) Subject matter comprising means for receiving a detected radiation signal (e.g., X-ray, infrared, laser, etc.) transmitted through or reflected from the object.

SEE OR SEARCH THIS CLASS, SUBCLASS:

8, for well logging or borehole by radiation.

28, for molecular structure or composition determination using radiant energy.

49, for flow metering using radiant energy.

134+, for temperature measuring system by radiant energy.

172, for thickness or width measurement system using radiant energy.

SEE OR SEARCH CLASS

250, Radiant Energy,

306+, for inspection of solids or liquids by charged particles, and subclasses 492.1+ for irradiation of objects or material.

378, X-Ray or Gamma Ray Systems or Devices,

58+, for flaw analysis application.