US PATENT SUBCLASS 702 / 22
.~ Chemical analysis

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
22.~ Chemical analysis {6}
23  DF  .~.~> Quantitative determination (e.g., mass, concentration, density) {3}
27  DF  .~.~> Molecular structure or composition determination {1}
29  DF  .~.~> Particle size determination
30  DF  .~.~> Chemical property analysis
31  DF  .~.~> Specific operation control system
32  DF  .~.~> Specific signal data processing

DEFINITION

Classification: 702/22

Chemical analysis:

(under subclass 1) Subject matter including means for analyzing a sample through study of its chemical aspect.

SEE OR SEARCH THIS CLASS, SUBCLASS:

19+, for measurement system in biological or biochemical application.

SEE OR SEARCH CLASS

71, Chemistry: Fertilizers, appropriate subclasses.

204, Chemistry: Electrical and Wave Energy, appropriate subclasses.

260, Chemistry of Carbon Compounds, appropriate subclasses.

364, Electrical Computers and Data Processing Systems, 528.01+, for chemical process control or monitoring systems.

423, Chemistry of Inorganic Compounds, appropriate subclasses.

436, Chemistry: Analytical and Immunological Testing, appropriate subclasses.