US PATENT SUBCLASS 702 / 30
.~.~ Chemical property analysis

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
22  DF  .~ Chemical analysis {6}
30.~.~ Chemical property analysis

DEFINITION

Classification: 702/30

Chemical property analysis:

(under subclass 22) Subject matter comprising means for determining a chemical characteristic (e.g., specific gravity, conductivity, specific enthalpy, yield, phase, diffusion, etc.) of the sample.