US PATENT SUBCLASS 702 / 81
.~ Quality evaluation

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
81.~ Quality evaluation {3}
82  DF  .~.~> Having judging means (e.g., accept/reject)
83  DF  .~.~> Sampling Inspection Plan
84  DF  .~.~> Quality control

DEFINITION

Classification: 702/81

Quality evaluation:

(under subclass 1) Subject matter comprising means for gathering data, usually on a manufacturing or assembly line, to determine the quality of a product.

SEE OR SEARCH THIS CLASS, SUBCLASS:

182+, for performance or efficiency evaluation in a generic measurement system.

SEE OR SEARCH CLASS

364, Electrical Computers and Data Processing Systems,

468.15+, for performance monitoring of a product assembly or manufacturing with significant recitation of how the product is assembled or manufactured.