US PATENT SUBCLASS 702 / 84
.~.~ Quality control


Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
81  DF  .~ Quality evaluation {3}
84.~.~ Quality control


DEFINITION

Classification: 702/84

Quality control:

(under subclass 81) Subject matter wherein the gathered data is evaluated and fed back to regulate (e.g., adjust, maintain, etc.) the manufacturing or assembly line to ensure a desired quality.

SEE OR SEARCH CLASS

364, Electrical Computers and Data Processing Systems,

468.16+, for quality control a product assembly or manufacturing with significant recitation of how the product is assembled or manufactured.