US PATENT SUBCLASS 702 / 83
.~.~ Sampling Inspection Plan

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
81  DF  .~ Quality evaluation {3}
83.~.~ Sampling Inspection Plan

DEFINITION

Classification: 702/83

Sampling Inspection Plan:

(under subclass 81) Subject matter wherein means for gathering data comprises details of a specifically defined plan created for the gathering of data related to the product.