US PATENT SUBCLASS 702 / 57
.~ Electrical signal parameter measurement system

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
57.~ Electrical signal parameter measurement system {6}
58  DF  .~.~> For electrical fault detection {1}
60  DF  .~.~> Power parameter {2}
64  DF  .~.~> Voltage or current {1}
66  DF  .~.~> Waveform analysis {5}
79  DF  .~.~> Time-related parameter (e.g., pulse-width, period, delay, etc.)
80  DF  .~.~> Specified memory location generation for storage

DEFINITION

Classification: 702/57

Electrical signal parameter measurement system:

(under subclass 1) Subject matter wherein the measurement system or process is designed for or utilized to measure an electrical parameter.

SEE OR SEARCH THIS CLASS, SUBCLASS:

189+, for generic measured signal processing.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing, appropriate subclasses for the measuring or testing of electrical properties where significant structure to the electrical measuring or testing device is claimed.

364, Electrical Computers and Data Processing Systems,

528.21+, for power generation or distribution system.