US PATENT SUBCLASS 702 / 79
.~.~ Time-related parameter (e.g., pulse-width, period, delay, etc.)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
57  DF  .~ Electrical signal parameter measurement system {6}
79.~.~ Time-related parameter (e.g., pulse-width, period, delay, etc.)

DEFINITION

Classification: 702/79

Time-related parameter (e.g., pulse width, period, delay, etc.):

(under subclass 57) Subject matter including means for generating time-related measurement (e.g., pulse width, period, delay) of at least one electrical signal.

SEE OR SEARCH THIS CLASS, SUBCLASS:

89, for calibration of a timer or correction of timing related error in measurement data.

125, for a testing system in which a signal is generated for system timing purposes.

176+, for a time duration or rate measurement system.

187, for history logging or time stamping.

SEE OR SEARCH CLASS 364, Electrical Computers and Data Processing Systems,

528.41, for control based on an elapsed time.