US PATENT SUBCLASS 702 / 80
.~.~ Specified memory location generation for storage

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
57  DF  .~ Electrical signal parameter measurement system {6}
80.~.~ Specified memory location generation for storage

DEFINITION

Classification: 702/80

Specified memory location generation for storage:

(under subclass 57) Subject matter including means for generating address of storage for the measured electrical parameter.

SEE OR SEARCH THIS CLASS, SUBCLASS:

711, Electrical Computers and Digital Processing Systems: Memory, subclasses 200+ for address formation.