US PATENT SUBCLASS 702 / *
APPLICATIONS (364/400)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

*APPLICATIONS (364/400) {2}
*  DD  .~> Electrical/electronic engineering (364/480) {1}
FOR 115  DF  .~> Chemical and engineering sciences (364/496) {3}