US PATENT SUBCLASS 702 / 127
MEASUREMENT SYSTEM

Current as of: June, 1999
Click HD for Main Headings
Click for All Classes

Internet Version by PATENTEC © 1999      Terms of Use


702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127MEASUREMENT SYSTEM {15}
128  DF  .~> Article count or size distribution {1}
130  DF  .~> Temperature measuring system {5}
137  DF  .~> Density
138  DF  .~> Pressure {2}
141  DF  .~> Accelerometer
142  DF  .~> Speed {4}
150  DF  .~> Orientation or position {3}
155  DF  .~> Dimensional determination {6}
173  DF  .~> Weight {2}
176  DF  .~> Time duration or rate {2}
179  DF  .~> Statistical measurement {2}
182  DF  .~> Performance or efficiency evaluation {2}
187  DF  .~> History logging or time stamping
188  DF  .~> Remote supervisory monitoring
189  DF  .~> Measured signal processing {3}

DEFINITION

Classification: 702/127

MEASUREMENT SYSTEM:

(under the class definition) Subject matter wherein data processing and calculating computer includes a generic measurement system or process.

SEE OR SEARCH THIS CLASS, SUBCLASS:

1+, for data processing in a specific measurement system.

85+, for data processing in a calibration or correction of measurement system.

108+, for data processing in a testing system.

SEE OR SEARCH CLASS

73, Measuring and Testing, appropriate subclasses, for measuring and testing apparatus or processes not found elsewhere. 324, Electricity: Measuring and Testing, appropriate subclasses for measuring or testing electricity, per se.

356, Optics: Measuring and Testing, appropriate subclasses.

358, Facsimile,

504, for measuring, testing, and calibration of natural color facsimile.

368, Horology: Time Measuring Systems or Devices, appropriate subclasses.

374, Thermal Measuring and Testing, appropriate subclasses.