US PATENT SUBCLASS 702 / 155
.~ Dimensional determination

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
155.~ Dimensional determination {6}
156  DF  .~.~> Area or volume
157  DF  .~.~> Radius or diameter
158  DF  .~.~> Linear distance or length {5}
166  DF  .~.~> Height or depth
167  DF  .~.~> Contouring {2}
170  DF  .~.~> Thickness or width {2}

DEFINITION

Classification: 702/155

Dimensional determination:

(under subclass 127) Subject matter comprising means for determining or calculating a geometrical measurement representing a relationship between points, angles, surfaces, or solids.

SEE OR SEARCH THIS CLASS, SUBCLASS:

94+, for calibration or correction of a positional measurement system.

150+, for orientation or position determination.

SEE OR SEARCH CLASS

33, Geometrical Instruments, appropriate subclasses for related subject matter.

364, Electrical Computers and Data Processing Systems, 528.38, for dimensional control.