US PATENT SUBCLASS 702 / 158
.~.~ Linear distance or length

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
155  DF  .~ Dimensional determination {6}
158.~.~ Linear distance or length {5}
159  DF  .~.~.~> By reflected signal (e.g., ultrasonic, light, laser)
160  DF  .~.~.~> Pedometer
161  DF  .~.~.~> Electronic ruler
162  DF  .~.~.~> Micrometer
163  DF  .~.~.~> By rotary encoding means {2}

DEFINITION

Classification: 702/158

Linear distance or length:

(under subclass 155) Subject matter wherein the geometrical measurement is a displacement or a distance between two points or two planes.

SEE OR SEARCH THIS CLASS, SUBCLASS:

86, for linearization of measurement.

97, for calibration or correction of a length, distance, or thickness measurement system.

163+, for a system to measure rotary distance or length.

166, for a system to measure height or depth.

170, for a system to measure thickness or width. SEE OR SEARCH CLASS

33, Geometrical Instruments,

700+, for distance measuring.