US PATENT SUBCLASS 702 / 159-- .~.~.~ By reflected signal (e.g., ultrasonic, light, laser)

US PATENT SUBCLASS 702 / 159
.~.~.~ By reflected signal (e.g., ultrasonic, light, laser)

Current as of: June, 1999
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702 /	HD	DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127	DF	MEASUREMENT SYSTEM {15}
155	DF	.~ Dimensional determination {6}
158	DF	.~.~ Linear distance or length {5}
159		.~.~.~ By reflected signal (e.g., ultrasonic, light, laser)

DEFINITION

Classification: 702/159

By reflected signal (i.e., ultrasonic, light, laser):

(under subclass 158) Subject matter wherein the displacement or distance is measured from a returned wave of a target signal.

SEE OR SEARCH CLASS

342, Communications: Directive Radio Wave Systems and Devices (e.g., Radar, Radio Navigation),

118+, for distance determination using a directive radio wave system and device.

356, Optics: Measuring and Testing,

3+, for range or remote distance finding using an optical system.

367, Communications, Electrical: Acoustic Wave Systems and Devices,

99+, for distance or direction finding using an echo system.