US PATENT SUBCLASS 702 / 162
.~.~.~ Micrometer

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
155  DF  .~ Dimensional determination {6}
158  DF  .~.~ Linear distance or length {5}
162.~.~.~ Micrometer

DEFINITION

Classification: 702/162

Micrometer

(under subclass 158) Subject matter comprising an instrument adapted for measuring minute distances with high accuracy.

SEE OR SEARCH CLASS

33, Geometrical Instruments,

813+, for distance measuring by a micrometer.