US PATENT SUBCLASS 702 / 170
.~.~ Thickness or width
Current as of:
June, 1999
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702 /
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DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING
127
DF
MEASUREMENT SYSTEM
{15}
155
DF
.~ Dimensional determination {6}
170
.~.~ Thickness or width {2}
171
DF
.~.~.~
> By ultrasonic
172
DF
.~.~.~
> By radiant energy (e.g., X-ray, light)
DEFINITION
Classification: 702/170
Thickness or width:
(under subclass 155) Subject matter wherein the geometrical measurement is thickness or width.
SEE OR SEARCH THIS CLASS, SUBCLASS:
97, for calibration or correction of a length, distance, or thickness measurement system.
158+, for a system to measure linear distance or length.
163+, for a system to measure rotary distance or length.
SEE OR SEARCH CLASS
250, Radiant Energy, 559.01+, for photocell systems which detect web, strand, strip, or sheet materials.
356, Optics: Measuring and Testing,
429+, for monitoring of webs.
