US PATENT SUBCLASS 702 / 172
.~.~.~ By radiant energy (e.g., X-ray, light)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
155  DF  .~ Dimensional determination {6}
170  DF  .~.~ Thickness or width {2}
172.~.~.~ By radiant energy (e.g., X-ray, light)

DEFINITION

Classification: 702/172

By radiant energy (e.g., X-ray, light):

(under subclass 170) Subject matter wherein the thickness or width is determined by detecting an incident or reflected radiation beam (e.g., X-ray, light etc.).

SEE OR SEARCH THIS CLASS, SUBCLASS:

8, for well logging or borehole study by radiation.

28, for molecular structure or composition determination using radiant energy.

40, for flaw or defect detection by radiant energy.

49, for flow metering using radiant energy.

134+, for a temperature measuring system using radiant

energy. SEE OR SEARCH CLASS

250, Radiant Energy, appropriate subclasses.