US PATENT SUBCLASS 702 / 167
.~.~ Contouring

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
155  DF  .~ Dimensional determination {6}
167.~.~ Contouring {2}
168  DF  .~.~.~> By probe (e.g., contact)
169  DF  .~.~.~> Center of gravity

DEFINITION

Classification: 702/167

Contouring:

(under subclass 155) Subject matter wherein the geometrical measurement includes profile information representing structure or shape or outline of a surface or body or figure.

(1) Note. This subclass includes coordinate or non-contact measuring apparatus or methods.