US PATENT SUBCLASS 702 / 168
.~.~.~ By probe (e.g., contact)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
155  DF  .~ Dimensional determination {6}
167  DF  .~.~ Contouring {2}
168.~.~.~ By probe (e.g., contact)

DEFINITION

Classification: 702/168

By probe (e.g., contact):

(under subclass 167) Subject matter wherein the profile information is measured by a probe which makes contact with the surface, body, or figure.