US PATENT SUBCLASS 702 / 166
.~.~ Height or depth


Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
155  DF  .~ Dimensional determination {6}
166.~.~ Height or depth


DEFINITION

Classification: 702/166

Height or depth:

(under subclass 155) Subject matter wherein the geometrical measurement is a vertically measured distance between a reference base and something above or below it.

SEE OR SEARCH THIS CLASS, SUBCLASS:

97, for calibration or correction of a length, distance, or thickness measurement system.

158+, for a system to measure linear distance or length.

163+, for a system to measure rotary distance or length.

170, for a system to measure thickness or width.

SEE OR SEARCH CLASS

33, Geometrical Instruments, 719, for sound-type depth indication.