US PATENT SUBCLASS 702 / 189
.~ Measured signal processing

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
189.~ Measured signal processing {3}
190  DF  .~.~> Signal extraction or separation (e.g., filtering) {2}
198  DF  .~.~> Measurement conversion processing (e.g., true-to-RMS value)
199  DF  .~.~> Averaging

DEFINITION

Classification: 702/189

Measured signal processing:

(under subclass 127) Subject matter comprising means for post-processing a measured signal.

SEE OR SEARCH THIS CLASS, SUBCLASS:

32, for specific signal processing in a chemical analysis system.