US PATENT SUBCLASS 702 / 190
.~.~ Signal extraction or separation (e.g., filtering)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
189  DF  .~ Measured signal processing {3}
190.~.~ Signal extraction or separation (e.g., filtering) {2}
191  DF  .~.~.~> For noise removal or suppression {2}
196  DF  .~.~.~> Using matrix operation {1}

DEFINITION

Classification: 702/190

Signal extraction or separation (e.g., filtering):

(under subclass 189) Subject matter comprising means for

obtaining a particular signal of interest from an incoming input signal by subjecting the incoming input signal to a specific separating technique (e.g., filtering) or means for dividing an incoming input signal into at least two signals of interest.

SEE OR SEARCH THIS CLASS, SUBCLASS:

17, for filtering or noise reduction in seismic prospecting.

69, for a system to measure signal quality in a waveform.

70, for waveform extraction.

106, for signal frequency or phase correction.

107, for circuit tuning. 124+, for signal generation or waveform shaping in a testing system.

SEE OR SEARCH CLASS

364, Electrical Computers and Data Processing Systems,

724.011+, for digital filtering, and subclass 825 for analog filtering.