US PATENT SUBCLASS 702 / 150
.~ Orientation or position
Current as of:
June, 1999
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702 /
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DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING
127
DF
MEASUREMENT SYSTEM
{15}
150
.~ Orientation or position {3}
151
DF
.~.~
> Angular position
152
DF
.~.~
> 3D position {1}
154
DF
.~.~
> Inclinometer
DEFINITION
Classification: 702/150
Orientation or position:
(under subclass 127) Subject matter comprising means for measuring a spatial relationship of an object with respect to a reference axis.
SEE OR SEARCH THIS CLASS, SUBCLASS:
92+, for calibration or correction of a directional measurement system.
94+, for calibration or correction of a positional measurement system.
155+, for dimensional determination.
SEE OR SEARCH CLASS
33, Geometrical Instruments, appropriate subclasses, particularly
300+, for an indicator of direction of force transversing natural media. 356, Optics: Measuring and Testing,
138+, for angle measuring or angular axial alignment and subclasses 399+ for alignment in lateral direction.
364, Electrical Computers and Data Processing Systems,
528.37, for positional control.
