US PATENT SUBCLASS 702 / 152
.~.~ 3D position

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
150  DF  .~ Orientation or position {3}
152.~.~ 3D position {1}
153  DF  .~.~.~> 3D orientation

DEFINITION

Classification: 702/152

3D position:

(under subclass 150) Subject matter comprising means for determining X-Y-Z coordinates of an object.