US PATENT SUBCLASS 702 / 179
.~ Statistical measurement


Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

127  DF  MEASUREMENT SYSTEM {15}
179.~ Statistical measurement {2}
180  DF  .~.~> Histogram distribution
181  DF  .~.~> Probability determination


DEFINITION

Classification: 702/179

Statistical measurement:

(under subclass 127) Subject matter including means for gathering or measuring or calculating parameters (e.g., mean, deviation, variance, range etc.) using principles of statistics.

SEE OR SEARCH THIS CLASS, SUBCLASS:

194+, for noise removal or extraction in a measured signal by mathematical attenuation.

196+, for signal extraction or separation in a measured signal using matrix operation.

199, for a generic averaging operation performed on a measured signal.