US PATENT SUBCLASS 702 / 75
.~.~.~ Frequency

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
57  DF  .~ Electrical signal parameter measurement system {6}
66  DF  .~.~ Waveform analysis {5}
75.~.~.~ Frequency {2}
76  DF  .~.~.~.~> Frequency spectrum {1}
78  DF  .~.~.~.~> By count (e.g., pulse)

DEFINITION

Classification: 702/75

Frequency:

(under subclass 66) Subject matter having means for determining or analyzing frequency of the electromagnetic wave.

SEE OR SEARCH THIS CLASS, SUBCLASS:

70, for waveform extraction.

71, for waveform to waveform comparison including frequency correlator or comparison.

74, for means to determine the presence or absence of a specified signal contained within other signal.

190+, for processing of a measured signal including filtering.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing, 76.39+, for the measuring of frequency.