US PATENT SUBCLASS 702 / 69
.~.~.~ Signal quality (e.g., timing jitter, distortion, signal-to-noise ratio)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
57  DF  .~ Electrical signal parameter measurement system {6}
66  DF  .~.~ Waveform analysis {5}
69.~.~.~ Signal quality (e.g., timing jitter, distortion, signal-to-noise ratio)

DEFINITION

Classification: 702/69

Signal quality (e.g., timing jitter, distortion, signal-to-noise ratio):

(under subclass 66) Subject matter comprising means for determining or estimating an impairment in the electrical wave (e.g., timing jitter, distortion, signal to noise ratio, etc.).

(1) Note. This subclass does not include noise reduction.

SEE OR SEARCH THIS CLASS, SUBCLASS:

106, for signal frequency or phase correction.

124+, for signal generation or waveform shaping in a testing system.

190+, for signal extraction or separation.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing, 620+, for measuring and testing of distortion.