US PATENT SUBCLASS 702 / 74
.~.~.~.~ Signal-in-signal determination

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
57  DF  .~ Electrical signal parameter measurement system {6}
66  DF  .~.~ Waveform analysis {5}
71  DF  .~.~.~ Waveform-to-waveform comparison {3}
74.~.~.~.~ Signal-in-signal determination

DEFINITION

Classification: 702/74

Signal-in-signal determination:

(under subclass 71) Subject matter comprising means for detecting the presence or absence of at least one specified signal contained within other signal (e.g., noise superimposed on an information signal, burst signal, tone signal, or certain frequencies within a pulse code modulated signal).

SEE OR SEARCH THIS CLASS, SUBCLASS:

70, for signal extraction wherein a particular signal is identified and extracted without comparison.

75+, for means to determine or analyze frequency of electric wave.

190+, for processing of a measured signal including signal extraction or separation.