US PATENT SUBCLASS 702 / 72
.~.~.~.~ Phase comparison

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

1  DF  MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT {6}
57  DF  .~ Electrical signal parameter measurement system {6}
66  DF  .~.~ Waveform analysis {5}
71  DF  .~.~.~ Waveform-to-waveform comparison {3}
72.~.~.~.~ Phase comparison

DEFINITION

Classification: 702/72

Phase comparison:

(under subclass 71) Subject matter comprising means for comparing a phase of the first waveform to that of the second waveform, or to a reference phase of a reference signal.

SEE OR SEARCH CLASS

324, Electricity: Measuring and Testing,

76.52+, for frequency of cyclic current or voltage by phase comparison, and subclasses 76.77+ for phase comparison between waveforms.