US PATENT SUBCLASS 702 / FOR 160
.~.~.~.~ Using difference involving initial measurement data (364/571.05)

Current as of: June, 1999
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702 /   HD   DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING

FOR 134  DF  MEASURING, TESTING, OR MONITORING (364/550) {3}
FOR 155  DF  .~ Operations performed (364/570) {11}
FOR 156  DF  .~.~ Calibration or compensation {3}
FOR 157  DF  .~.~.~ Having mathematical operation on initial measurement data (364/571.02) {4}
FOR 160.~.~.~.~ Using difference involving initial measurement data (364/571.05)

DEFINITION

Classification: 702/FOR.160

Using difference involving initial measurement data:

Foreign art collections where the offset between two successive initial measurements or an initial measurement and a standard is utilized to a compensate initial data.